S N Pandey
Motilal Nehru National Institute of Technology, India
Title: Morphological studies of virgin and ion irradiated nanostructured BaF2 thin films surfaces
Biography
Biography: S N Pandey
Abstract
The surface roughness and fractal analysis of virgin and swift heavy ions (SHI) irradiated BaF2 thin films were studied. Electron beam evaporation technique was used to deposit BaF2 thin films on Si <1 1 1> substrate at room temperature of thickness 100 nm. The films were irradiated with 120 MeV Ag9+ ions at various fluences in the range 1×1011 to 3×1013 ions/cm2. The virgin and irradiated films were characterized by atomic force microscopy (AFM). Fractal analysis on AFM images were performed using height-height correlation and autocorrelation functions to extract out roughness exponent, lateral correlation length and interface width. The computed results show that the surface roughness decreases with increase in ion fluence, while the fractal dimension increases initially followed by a decrease with ion fluence. The results show that the surface properties are greatly affected by the ion irradiation.