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Yutaka Ohno


Yutaka Ohno

Tohoku University, Japan

Biography

Yutaka Ohno (PhD: Physics) is working in the Institute for Materials Research, Tohoku University (http://www-lab.imr.tohoku.ac.jp/~yutakaohno/). He is also working in the CREST research project (Grant No. JPMJCR17J1 (2017-2023)) in Japan Science and Technology Agency. A focus is on quantitative analyses of the impurity segregation ability of grain boundaries in Si and compounds by atom probe tomography (APT, with a spatial resolution less than 0.4nm) combined with scanning transmission electron microscopy (STEM) and ab initio calculations, but also on the study of atomistic structures of semiconductor nanostructures by optical measurements (cathodoluminescence, micro-photoluminescence, near-field optical measurements) under TEM.

Abstract

Abstract : Chemical nanoanalyses of Si grain boundaries towards the fabrication of highfunctional Si solar cells